Hydrofluoric acid 49%, CMOS, J.T.Baker®
Supplier: AVANTOR PERFORMANCE MATERIAL LLC
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Danger
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Management of Change (MOC) category = R
BAKR9574-89
9574-07
BAKR9574-4X
BAKR9574-09
9574-07
9574-09
JT9574-4XCS
3602.28
USD
JT9574-4X
JT9574-9
JT9574-89
JT9574-7
CAJT9574-9
CAJT9574-7
Hydrofluoric acid 49%, CMOS, J.T.Baker®
Hydrofluoric acid
Formula:
HF MW: 20.01 g/mol Storage Temperature: Ambient |
MDL Number:
MFCD00011346 CAS Number: 7664-39-3 EINECS: 231-634-8 UN: 1790 ADR: 8,II |
Specification Test Results
For Microelectronic Use | |
Assay (HF) (by acidimetry) | 48.8 - 49.2 % |
Color (APHA) | ≤7 |
Fluosilicic Acid (H₂SiF₆) | ≤50000.0 ppb |
Residue after Ignition | ≤5 ppm |
Chloride (Cl) | ≤3 ppm |
Nitrate (NO₃) | ≤2 ppm |
Phosphate (PO₄) | ≤0.7 ppm |
Sulfate and Sulfite (as SO₄) | ≤1000.0 ppb |
Trace Impurities - Aluminum (Al) | ≤20 ppb |
Arsenic and Antimony (as As) | ≤10.0 ppb |
Trace Impurities - Barium (Ba) | ≤10.0 ppb |
Trace Impurities - Beryllium (Be) | ≤10.0 ppb |
Trace Impurities - Bismuth (Bi) | ≤20.0 ppb |
Trace Impurities - Boron (B) | ≤10.0 ppb |
Trace Impurities - Cadmium (Cd) | ≤10.0 ppb |
Trace Impurities - Calcium (Ca) | ≤50.0 ppb |
Trace Impurities - Chromium (Cr) | ≤10.0 ppb |
Trace Impurities - Cobalt (Co) | ≤10.0 ppb |
Trace Impurities - Copper (Cu) | ≤10.0 ppb |
Trace Impurities - Gallium (Ga) | ≤10.0 ppb |
Trace Impurities - Germanium (Ge) | ≤20 ppb |
Trace Impurities - Gold (Au) | ≤10.0 ppb |
Heavy Metals (as Pb) | ≤100 ppb |
Trace Impurities - Iron (Fe) | ≤50.0 ppb |
Trace Impurities - Lead (Pb) | ≤10.0 ppb |
Trace Impurities - Lithium (Li) | ≤10.0 ppb |
Trace Impurities - Magnesium (Mg) | ≤20 ppb |
Trace Impurities - Manganese (Mn) | ≤10.0 ppb |
Trace Impurities - Molybdenum (Mo) | ≤10.0 ppb |
Trace Impurities - Nickel (Ni) | ≤10.0 ppb |
Trace Impurities - Niobium (Nb) | ≤10.0 ppb |
Trace Impurities - Potassium (K) | ≤20.0 ppb |
Trace Impurities - Silicon (Si) | ≤1000.0 ppb |
Trace Impurities - Silver (Ag) | ≤10.0 ppb |
Trace Impurities - Sodium (Na) | ≤50.0 ppb |
Trace Impurities - Strontium (Sr) | ≤10.0 ppb |
Trace Impurities - Tantalum (Ta) | ≤10.0 ppb |
Trace Impurities - Thallium (Tl) | ≤10.0 ppb |
Trace Impurities - Tin (Sn) | ≤20.0 ppb |
Trace Impurities - Titanium (Ti) | ≤10.0 ppb |
Trace Impurities - Vanadium (V) | ≤10.0 ppb |
Trace Impurities - Zinc (Zn) | ≤20.0 ppb |
Trace Impurities - Zirconium (Zr) | ≤10.0 ppb |
Particle Count at point of fill - 0.5 µm and greater | ≤150 par/ml |
Particle Count at point of fill - 1.0 µm and greater | ≤25 par/ml |
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