Ammonium fluoride solution 40% VLSI, Semiconductor grade (Honeywell 17600)
Supplier: Honeywell Research Chemicals
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Danger
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Synonyms:
Fluoroammonium
40292H-5L
BJ40292H-5LEA
164.4
USD
BJ40292H-5L
Ammonium fluoride solution 40% VLSI, Semiconductor grade (Honeywell 17600)
Ammonium fluoride
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Formula:
NH₄F MW: 37.04 g/mol Boiling Pt: >100 °C (1.013 hPa) Density: 1.110 g/cm³ (20 °C) Storage Temperature: Ambient |
MDL Number:
MFCD00011423 CAS Number: 12125-01-8 UN: 3287 ADR: 6.1,III |
Specification Test Results
Particles > 0,5 µm | Max. 250 P/ml |
Assay | 40 - 41 % |
Residue on ignition (SO₄) | Max. 10 ppm |
pH (1 %,20°C) | 6.2 - 7.0 |
Silver (Ag) | Max. 0.05 ppm |
Aluminium (Al) | Max. 0.05 ppm |
Arsenic, antimony (as As) | Max. 0.03 ppm |
Gold (Au) | Max. 0.02 ppm |
Boron (B) | Max. 0.05 ppm |
Barium (Ba) | Max. 0.01 ppm |
Beryllium (Be) | Max. 0.01 ppm |
Bismuth (Bi) | Max. 0.02 ppm |
Calcium (Ca) | Max. 0.1 ppm |
Cadmium (Cd) | Max. 0.01 ppm |
Cobalt (Co) | Max. 0.01 ppm |
Chromium (Cr) | Max. 0.01 ppm |
Copper (Cu) | Max. 0.01 ppm |
Iron (Fe) | Max. 0.05 ppm |
Gallium (Ga) | Max. 0.01 ppm |
Germanium (Ge) | Max. 0.05 ppm |
Indium (In) | Max. 0.01 ppm |
Potassium (K) | Max. 0.05 ppm |
Lithium (Li) | Max. 0.01 ppm |
Magnesium (Mg) | Max. 0.05 ppm |
Manganese (Mn) | Max. 0.01 ppm |
Molybdenum (Mo) | Max. 0.01 ppm |
Sodium (Na) | Max. 0.1 ppm |
Nickel (Ni) | Max. 0.01 ppm |
Lead (Pb) | Max. 0.01 ppm |
Platinum (Pt) | Max. 0.05 ppm |
Silicon (Si) | Max. 200 ppm |
Tin (Sn) | Max. 0.02 ppm |
Strontium (Sr) | Max. 0.01 ppm |
Titanium (Ti) | Max. 0.01 ppm |
Thallium (Tl) | Max. 0.02 ppm |
Vanadium (V) | Max. 0.01 ppm |
Zinc (Zn) | Max. 0.05 ppm |
Zirconium (Zr) | Max. 0.01 ppm |
Ammonium hydrogen difluoride (NH₄HF₂) | Max. 200 ppm |
Chloride (Cl) | Max. 4 ppm |
Phosphate (PO₄) | Max. 0.2 ppm |
Sulfate (SO₄) | Max. 2 ppm |
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