Double FIB Sample and Grid Holder, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences
75950-04
103306-250EA 581.97 USD
103306-250
Double FIB Sample and Grid Holder, Electron Microscopy Sciences
Tools Storage
Double FIB sample and grid holder holds sample mounted on two standard pin stubs for FIB milling and lift-out procedures.

  • Vacuum grade aluminum with brass screws
  • Conveniently holds two FIB grids close to the sample to mount prepared TEM lamellae on the FIB grid for TEM imaging
  • Cost-effective and suitable for all FIB/SEM systems which accept pin mount holders, including the FEI, ZEISS and Tescan systems

Overall dimensions: 36.5 x 12.7 x 11.6 mm (1.44" x 0.5" x 0.46")
Pin: Standard 3.2 mm (1/8")

Delivery information: Includes Philips screwdriver.
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