Tripod Polisher® TEM/SEM Sample Preparation, 590, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences
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101411-584EA 2034.2 USD
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Tripod Polisher® TEM/SEM Sample Preparation, 590, Electron Microscopy Sciences
Polishers and Tumblers
A Tripod Polisher® was designed to prepare accurately micro sizes of TEM and SEM samples.

  • Limited ion milling
  • No strong chemicals are used to prepare the specimen
  • Reduce preferential thinning, radiation damage, and heating of the sample

Used to prepare both plan-view and cross-sections from a variety of sample materials, such as ceramics, composites, metals and, geological specimens. The same sample can be studied with both SEM and TEM and hence reduces sample preparation.
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