You Searched For: Graticules, Reticles and Grids

<p><span style=Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.

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Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.


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Description: Thin Bar Hexagonal Grid
Catalog Number: 103305-188
Supplier: Electron Microscopy Sciences


Description: Consists of 15 lines of equal length connecting the verticals of a regular hexagonal point network, Weibel Type 1 for stereology, surface chrome image
Catalog Number: 100499-220
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Description: Thin Bar Hexagonal Grid
Catalog Number: 103304-734
Supplier: Electron Microscopy Sciences


Description: Thin Bar Hexagonal Grid
Catalog Number: 103305-886
Supplier: Electron Microscopy Sciences


Description: Thin Bar Hexagonal Grid
Catalog Number: 103304-328
Supplier: Electron Microscopy Sciences


Catalog Number: 100496-366
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Description: Chalkley point array, surface chrome image, this is used to quickly determine the relationship of components to each other using random sampling
Catalog Number: 100499-284
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 102096-022
Supplier: Electron Microscopy Sciences


Catalog Number: 100495-964
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 102100-748
Supplier: Electron Microscopy Sciences


Description: Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 200 mesh, Thickness: Extra thick option C: 25-50 /20-30 nm, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103305-024
Supplier: Electron Microscopy Sciences


Description: Crossed micrometer scale NE17, 10mm long with 0.1mm subdivions, Surface chrome image, Used as a horizontal and a vertical scale and is useful when interested in measurement in different axis, Diameter: 25mm
Catalog Number: 103305-410
Supplier: Electron Microscopy Sciences


Description: Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 300 mesh, Thickness: Ultra-Thin Option C: 3-4 nm/20-30 nm, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103304-322
Supplier: Electron Microscopy Sciences


Description: Formvar/Carbon Film Thin Bar Hexagonal Grid, Type: 400 mesh, Thickness: Thick option A: 15-20 nm/1 nm carbon, Coating: Copper, carbon: Formvar stabilized with evaporated carbon provides excellent support especially for ultrathin Sections
Catalog Number: 103304-568
Supplier: Electron Microscopy Sciences


Description: Thin Bar Hexagonal Grid
Catalog Number: 103305-340
Supplier: Electron Microscopy Sciences


Description: Thin Bar Hexagonal Grid
Catalog Number: 103305-184
Supplier: Electron Microscopy Sciences


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