You Searched For: Graticules, Reticles and Grids

<p><span style=Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.

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Graticules, reticles, and grids are precision tools used in microscopy, optical instruments, and imaging systems to aid in measurement, alignment, and targeting. Commonly integrated into eyepieces or slide-mounted formats, they enhance accuracy during observations and support standardized data collection in research, metrology, and clinical diagnostics. With various patterns and calibrations available, these tools are adaptable to diverse analytical tasks, improving consistency and workflow efficiency across scientific and technical disciplines.


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Description: Chalkley point array, surface chrome image, this is used to quickly determine the relationship of components to each other using random sampling
Catalog Number: 100499-288
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 102096-030
Supplier: Electron Microscopy Sciences


Description: Used as a horizontal and a vertical scale, useful when interested in measurement in different axis, crossed micrometer scales 10mm long with 0.1mm subdivions, surface chrome image
Catalog Number: 100499-050
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Catalog Number: 102096-022
Supplier: Electron Microscopy Sciences


Catalog Number: 102096-024
Supplier: Electron Microscopy Sciences


Catalog Number: 102096-020
Supplier: Electron Microscopy Sciences


Catalog Number: 100494-992
Supplier: Electron Microscopy Sciences

Minority or Woman-Owned Business Enterprise


Description: Thin Bar Hexagonal Grid
Catalog Number: 103304-572
Supplier: Electron Microscopy Sciences


Description: Thin Bar Hexagonal Grid
Catalog Number: 103305-188
Supplier: Electron Microscopy Sciences


Catalog Number: 102100-756
Supplier: Electron Microscopy Sciences


Description: Foil, Type: R 1.2/20, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 20um, Period: 21.2um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-040
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 17/5um, Type: Nickle Grid 300Mesh, with Carbon film, Predefined holes, Hole Size: 17.5um, Period: 22.5um, Pre-defined holes has advantages in electron microscopy(EM) and low-energy electron point source(LEEPS) microscopy when compared with conventional holey film, Space between holes is 5um
Catalog Number: 76440-910
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R1.2/20, Grid Type: Gold, 200 Mesh, with approx 1.2um circular holes and spacing of approx 20 um between the holes, used at Magnifications of 50,000x and higher, Period: 20 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)
Catalog Number: 76440-436
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R 1.2/1.3, Holey Carbon Film, Grid Type: Copper 400 Mesh, Hole Size: 1.2um, Spacing: 1.3um, Period: 2.5um, Magnifications of 50,000x and higher, perforated support foil, has advantages in electron microscopy (EM) or low-energy electron point source (LEEPS) microscopy
Catalog Number: 76441-020
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, Type: R17/5, Grid Type: Gold, 200 Mesh, with approx 17.5 um circular holes and spacing of approx 5 um between the holes, Period: 22.5 Um, Material: holey carbon film, which facilitates the use of automation in TEM, has advantages in (EM)/low-energy electron point source
Catalog Number: 76440-332
Supplier: ELECTRON MICROSCOPY SCIENCE


Description: Foil, R 1.2/20 um, Type: Gold Grid 300 Mesh, with perforated Ultrathin Holey Carbon film, Hole Size: 1.2 um, Period: 21.2 um, It has advantages in electron microscopy or low-energy electron point source (LEEPS) microscopy when compared with conventional holey film, Space between holes is 20 um
Catalog Number: 76440-848
Supplier: ELECTRON MICROSCOPY SCIENCE


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