TIPCHECK for SPM and AFM, Electron Microscopy Sciences

Supplier: Electron Microscopy Sciences
80130-TI
100495-374EA 472.92 USD
100495-374
TIPCHECK for SPM and AFM, Electron Microscopy Sciences
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The Nioprobe device is used to determine the shape at the very apex of the tip probe for microscopy measurements.

The Problem: The physical probe used in AFM imaging is not ideally sharp. As a consequence, an AFM image does not reflect the true sample topography impartially, but rather represents the interaction of the tip with the sample surface. There is no avoiding this imperfection, which sets real limits on what may be validly inferred from an AFM image. Whether one is engaged in detailed, quantitative metrology or is simply using AFM images as a interpretive aid, it is imperative beMore Product Information
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